1 gal16v8/883 high performance e 2 cmos pld generic array logic? features ? high performance e 2 cmos ? technology ? 7.5 ns maximum propagation delay ? fmax = 100 mhz ? 6 ns maximum from clock input to data output ? ttl compatible 12 ma outputs ? ultramos ? advanced cmos technology ? 50% reduction in power from bipolar ? 75ma typ icc ? active pull-ups on all pins (gal16v8d-7 and gal16v8d-10) ?e 2 cell technology ? reconfigurable logic ? reprogrammable cells ? 100% tested/100% yields ? high speed electrical erasure (<100ms) ? 20 year data retention ? eight output logic macrocells ? maximum flexibility for complex logic designs ? programmable output polarity ? also emulates 20-pin pal ? devices with full function/ fuse map/parametric compatibility ? preload and power-on reset of all registers ? 100% functional testability ? applications include: ? dma control ? state machine control ? high speed graphics processing ? standard logic speed upgrade ? electronic signature for identification i/clk i i/o/q i i/o/q i i/o/q i i/o/q i i/o/q i i/o/q i i/o/q i i/o/q clk 8 8 8 8 8 8 8 8 oe olmc olmc olmc olmc olmc olmc olmc olmc programmable and-array (64 x 32) i/oe description the gal16v8/883 is a high performance e 2 cmos program- mable logic device processed in full compliance to mil-std-883. this military grade device combines a high performance cmos process with electrically erasable (e 2 ) floating gate technology to provide the highest speed/power performance available in the 883 qualified pld market. the gal16v8d/883, at 7.5ns maxi- mum propagation delay time, is the world's fastest military quali- fied cmos pld. the generic gal architecture provides maximum design flexibil- ity by allowing the output logic macrocell (olmc) to be config- ured by the user. the gal16v8/883 is capable of emulating all standard 20-pin pal ? devices with full function/fuse map/para- metric compatibility. unique test circuitry and reprogrammable cells allow complete ac, dc, and functional testing during manufacture. therefore, lattice semiconductor delivers 100% field programmability and functionality of all gal products. in addition, 100 erase/write cycles and data retention in excess of 20 years are specified. 22 0 i/clkii i i i i i i gnd vcc i/o/q i/o/q i/o/q i/o/q i/o/q i/o/q i/o/q i/o/q i/oe 3 4 6 8 91113 14 16 18 19 1 10 11 20 i/clk i i i i i i i i gnd vcc i/o/q i/o/q i/o/q i/o/q i/o/q i/o/q i/o/q i/o/q i/oe 5 15 gal16v8 top view lcc cerdip gal 16v8 copyright ? 1999 lattice semiconductor corp. all brand or product names are trademarks or registered trademarks of their respective holders. the specifications and information herein are subject to change without notice. lattice semiconductor corp., 5555 northeast moore ct., hillsboro, oregon 97124, u.s.a. february 1999 tel. (503) 268-8000; 1-800-lattice; fax (503) 268-8556; http://www.latticesemi.com 16v8mil_03 functional block diagram pin configuration select devices have been discontinued. see ordering information section for product status.
specifications gal16v8d-7/10/883 2 v il input low voltage vss ? 0.5 ? 0.8 v v ih input high voltage 2.0 ? vcc+1 v i il 1 input or i/o low leakage current 0v v in v il (max.) ? ? ? 100 a i ih input or i/o high leakage current 3.5v v in v cc ??10 a v ol output low voltage i ol = max. vin = v il or v ih ? ? 0.5 v v oh output high voltage i oh = max. v in = v il or v ih 2.4 ? ? v i ol low level output current ? ? 12 ma i oh high level output current ? ? ?2 ma i os 2 output short circuit current v cc = 5v v out = 0.5v t a = 25 c ?30 ? ?150 ma i cc operating power v il = 0.5v v ih = 3.0v l-7/-10 ? 75 130 ma supply current f toggle = 15mhz outputs open 1) the leakage current is due to the internal pull-up on all pins. see input buffer section for more information. 2) one output at a time for a maximum duration of one second. vout = 0.5v was selected to avoid test problems caused by tester ground degradation. characterized but not 100% tested. 3) typical values are at vcc = 5v and t a = 25 c recommended operating conditions case temperature (t c ) .............................. ?55 to 125 c supply voltage (v cc ) with respect to ground ..................... +4.50 to +5.50v dc electrical characteristics over recommended operating conditions (unless otherwise specified) symbol parameter condition min. typ. 3 max. units absolute maximum ratings (1) supply voltage v cc ...................................... ?0.5 to +7v input voltage applied .......................... ?2.5 to v cc +1.0v off-state output voltage applied ......... ?2.5 to v cc +1.0v storage temperature ................................ ?65 to 150 c case temperature with power applied ........................................ ?55 to 125 c 1.stresses above those listed under the ?absolute maximum rat- ings? may cause permanent damage to the device. these are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications). select devices have been discontinued. see ordering information section for product status.
specifications gal16v8d-7/10/883 3 t pd a input or i/o to combinational output 1 7.5 2 10 ns t co a clock to output delay 1617ns t cf 2 ? clock to feedback delay ? 6 ? 7 ns t su ? setup time, input or feedback before clock 7?10?ns t h ? hold time, input or feedback after clock 0?0?ns a maximum clock frequency with 76.9 ? 58.8 ? mhz external feedback, 1/(tsu + tco) f max 3 a maximum clock frequency with 76.9 ? 58.8 ? mhz internal feedback, 1/(tsu + tcf) a maximum clock frequency with 100 ? 62.5 ? mhz no feedback t wh ? clock pulse duration, high 5 ? 8 ? ns t wl ? clock pulse duration, low 5 ? 8 ? ns t en b input or i/o to output enabled 1 9 ? 10 ns b oe to output enabled 1 7 ? 10 ns t dis c input or i/o to output disabled 1 9 ? 10 ns c oe to output disabled 1 7 ? 10 ns parameter units test cond 1 . description 1) refer to switching test conditions section. 2) calculated from fmax with internal feedback. refer to fmax descriptions section. 3) refer to fmax descriptions section. symbol parameter maximum* units test conditions c i input capacitance 10 pf v cc = 5.0v, v i = 2.0v c i/o i/o capacitance 10 pf v cc = 5.0v, v i/o = 2.0v *characterized but not 100% tested. -10 min. max. -7 min. max. capacitance (t a = 25 c, f = 1.0 mhz) ac switching characteristics over recommended operating conditions select devices have been discontinued. see ordering information section for product status.
specifications gal16v8d/883 4 v il input low voltage vss ? 0.5 ? 0.8 v v ih input high voltage 2.0 ? vcc+1 v i il input or i/o low leakage current 0v v in v il (max.) ? ? ? 10 a i ih input or i/o high leakage current 3.5v v in v cc ??10 a v ol output low voltage i ol = max. vin = v il or v ih ? ? 0.5 v v oh output high voltage i oh = max. v in = v il or v ih 2.4 ? ? v i ol low level output current ? ? 12 ma i oh high level output current ? ? ?2 ma i os 1 output short circuit current v cc = 5v v out = 0.5v t a = 25 c ?30 ? ?150 ma i cc operating power v il = 0.5v v ih = 3.0v l -15/ -20/-30 ? 75 130 ma supply current f toggle = 15mhz outputs open 1) one output at a time for a maximum duration of one second. vout = 0.5v was selected to avoid test problems caused by tester ground degradation. characterized but not 100% tested. 3) typical values are at vcc = 5v and t a = 25 c dc electrical characteristics over recommended operating conditions (unless otherwise specified) symbol parameter condition min. typ. 2 max. units absolute maximum ratings (1) supply voltage v cc ...................................... ?0.5 to +7v input voltage applied .......................... ?2.5 to v cc +1.0v off-state output voltage applied ......... ?2.5 to v cc +1.0v storage temperature ................................ ?65 to 150 c case temperature with power applied ........................................ ?55 to 125 c 1.stresses above those listed under the ?absolute maximum rat- ings? may cause permanent damage to the device. these are stress only ratings and functional operation of the device at these or at any other conditions above those indicated in the operational sections of this specification is not implied (while programming, follow the programming specifications). recommended operating conditions case temperature (t c ) .............................. ?55 to 125 c supply voltage (v cc ) with respect to ground ..................... +4.50 to +5.50v select devices have been discontinued. see ordering information section for product status.
specifications gal16v8d/883 5 capacitance (t a = 25 c, f = 1.0 mhz) symbol parameter maximum* units test conditions c i input capacitance 10 pf v cc = 5.0v, v i = 2.0v c i/o i/o capacitance 10 pf v cc = 5.0v, v i/o = 2.0v *characterized but not 100% tested. t pd a input or i/o to combinational output 3 15 3 20 3 30 ns t co a clock to output delay 2 12 2 15 2 20 ns t cf 2 ? clock to feedback delay ? 12 ? 15 ? 20 ns t su ? setup time, input or feedback before clock 12 ? 15 ? 25 ? ns t h ? hold time, input or feedback after clock 0? 0? 0 ?ns a maximum clock frequency with 41.6 ? 33.3 ? 22.2 ? mhz external feedback, 1/(tsu + tco) f max 3 a maximum clock frequency with 41.6 ? 33.3 ? 22.2 ? mhz internal feedback, 1/(tsu + tcf) a maximum clock frequency with 50 ? 41.6 ? 33.3 ? mhz no feedback t wh ? clock pulse duration, high 10 ? 12 ? 15 ? ns t wl ? clock pulse duration, low 10 ? 12 ? 15 ? ns t en b input or i/o to output enabled ? 15 ? 20 ? 30 ns b oe to output enabled ? 15 ? 18 ? 25 ns t dis c input or i/o to output disabled ? 15 ? 20 ? 30 ns c oe to output disabled ? 15 ? 18 ? 25 ns 1) refer to switching test conditions section. 2) calculated from fmax with internal feedback. refer to fmax descriptions section. 3) refer to fmax descriptions section. -20 min. max. -15 min. max. parameter units description test cond 1 . -30 min. max. ac switching characteristics over recommended operating conditions select devices have been discontinued. see ordering information section for product status.
specifications gal16v8/883 6 registered output combinatorial output oe to output enable/disable input or i/o to output enable/disable f max with feedback clock width combinational output valid input input or i/o feedback t pd combinational output input or i/o feedback t en t dis clk ( w/o fb ) 1/ f max t wl t wh input or i/o feedback registered output clk valid input (external fdbk) t su t co t h 1/ f max oe registered output t en t dis clk registered feedback t cf t su 1/ f max (internal fdbk) switching waveforms select devices have been discontinued. see ordering information section for product status.
specifications gal16v8/883 7 f max with internal feedback 1/( t su+ t cf) note: tcf is a calculated value, derived by subtracting tsu from the period of fmax w/internal feedback ( tcf = 1/ fmax - tsu). the value of tcf is used primarily when calculating the delay from clocking a register to a combinatorial output (through registered feedback), as shown above. for example, the timing from clock to a combinatorial output is equal to tcf + tpd. f max with external feedback 1/( t su+ t co) note: f max with external feedback is calculated from measured tsu and tco. input pulse levels gnd to 3.0v input rise and fall times 3ns 10% ? 90% input timing reference levels 1.5v output timing reference levels 1.5v output load see figure 3-state levels are measured 0.5v from steady-state active level. output load conditions (see figure) test condition r 1 r 2 c l a 390 750 50pf b active high 750 50pf active low 390 750 50pf c active high 750 5pf active low 390 750 5pf test point c * l from output (o/q) under test +5v *c l includes test fixture and probe capacitance r 2 r 1 register logic array t co t su clk f max with no feedback note: f max with no feedback may be less than 1/( t wh + t wl). this is to allow for a clock duty cycle of other than 50%. register logic array clk t su + t h clk register logic array t cf t pd fmax descriptions switching test conditions select devices have been discontinued. see ordering information section for product status.
specifications gal16v8/883 8 mil process /883 = 883 process package power l = low power speed (ns) xxxxxxxx xx x x x device name _ d = cerdip r = lcc gal16v8d note : lattice semiconductor recognizes the trend in military device procurement towards using smd compliant devices, as such, ordering by this number is recom- mended. gal16v8 ordering information (mil-std-883 and smd) part number description 1. discontinued per pcn #06-07. #gniredro dpt )sn () sn( )sn( )sn () sn( ust )sn () sn( )sn( )sn () sn( oct )sn () sn( )sn( )sn () sn( cci )am () am( )am( )am () am( egakca p3 88-dts-li m# dms 5. 776 0 3 1p idrecnip-0 23 88/dl7-d8v61la ga r7093898-2695 03 1c clnip-0 23 88/rl7-d8v61lag 1 a27093898-2695 0 10 17 0 3 1p idrecnip-0 23 88/dl01-d8v61la ga r4093898-2695 03 1c clnip-0 23 88/rl01-d8v61la ga 24093898-2695 5 12 12 10 3 1p idrecnip-0 23 88/dl51-d8v61la ga r3093898-2695 03 1c clnip-0 23 88/rl51-d8v61la ga 23093898-2695 0 25 15 10 3 1p idrecnip-0 23 88/dl02-d8v61la ga r2093898-2695 03 1c clnip-0 23 88/rl02-d8v61la ga 22093898-2695 0 35 20 20 3 1p idrecnip-0 23 88/dl03-d8v61la ga r1093898-2695 select devices have been discontinued. see ordering information section for product status.
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